Дата публикации статьи в журнале: 4.02.2020
Название журнала: Американский Научный Журнал, Выпуск: № (33) / 2020, Том: 2, Страницы в выпуске: 37-41
Автор: Karaganda , Karaganda State University. named after E.A Buketov,
Автор: Zhanabergenov T.K.
Karaganda , Karaganda State University. named after E.A Buketov,
Автор: Makhanov К.М.
Karaganda , Karaganda State University. named after E.A Buketov,
Анотация: The study of atomic-smooth surfaces of solids is of fundamental and practical interest in connection
with the development of methods for the synthesis of nanostructures for electronics and photonics. Currently, there
are several methods for obtaining surfaces with a very small roughness comparable to the interatomic distance. In
this case, the question arises about the thickness of the surface layer of solids. At present, approaches based on the
use of x-ray radiation in the mode of a sliding beam are widely used and continue to actively develop. This paper
proposes methods for experimental and empirical determination of the thickness of the surface layer of halides,
sulfides and metal oxides. Experimentally, the thickness of the surface layer was determined from the size
dependence of the luminescence of these compounds. The empirical determination of the thickness of the surface
layer is based on the established regularity that the thickness of this layer is determined by one parameter — the
atomic volume of the substance under investigation. In the proposed work, the surface layer is divided into two
layers — the layer h = d (I) and the layer h≈10d (II). At h≈10d (II), the size dependence of the physical properties
of solids begins. When h = d (I), a phase transition occurs in the surface layer. In pure metals, the thickness of the
surface layer is significantly less than that of their compounds. For some compounds, the thickness of the surface
layer can reach micron values. At such values of the layer, the size dependence of the physical properties is still
observed
DOI:
Данные для цитирования: Yurov V.M. Zhanabergenov T.K. Makhanov К.М.. THICKNESS OF SURFACE LAYER OF HALOGENS, METAL SULFIDES AND OXIDES. Американский Научный Журнал. Физико-математические науки. 4.02.2020; № (33) / 2020(2):37-41.
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